BSE 探測器

反向散射電子（BSEs）是主電子束與樣品之間的引起相互作用所產生的高能量電子。

1. 4 通道半導體型 BSE 探測器
2. 清晰的金屬邊界影像
3. 比 SE 探測器具有更多的立體影像
4. EM 系列和 CX 系列均為選配配置
5. 透過數位板輕鬆控制軟體。
6. 使用 LV 模式拍攝的無濺鍍試樣清晰影像。

Backscattered electrons (BSEs) are high-energy electrons generated as a result of elastic interactions between the primary electron beam and the sample.

1. 4 Channel Semiconductor Type BSE Detector 
2. Clear Image about the boundary of metal
3. Much Stereoscopic Image than SE detector
4. Optional for both of EM Series and CX Series
5. Easy controlled S/W by Digital board
6. Clear Image of Non-Coating Specimen with LV mode