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Combined and Customized Laser Beam Induced Current, Photoluminescence and Electroluminescence Setups 型號:LBIC-PL-EL
Fast and reliable photocurrent mapping with highest resolution
    • Fast and reliable photocurrent mapping with highest resolution
    • In-depth defect detection, visualization and identification  – shunts, coating defects, localize inactive regions
    • Study degradation effects
    • Quality control tool
    • A laser beam scans the sample and the excited photocurrent is measured and the spectrally resolved luminescence is simultaneously detected
    • Electrical excitation for electroluminescence measurements
    • Different (multiple) laser wavelengths available
    • Up to 300×300 mm² scanning area
    • Mapping of all kinds of solar technologies: Perovskite, Organic, Silicon, CIGS, CdTE,
    • Different laser choices
    • Laser check for beam circularity
    • Versatile sample holder
    • Easy to use control software with data export
    • Different detector options for luminescence measurements, optimized to application and budget

    PL/EL Options

    Art. No. Description
    PL PL Upgrade – high quality detector system optimized for each application from 200-1700 nm
    EL EL Upgrade (PL option required)
    FC Fiber bundle connector for using the detector system with other inputs