選擇品牌
-
AARONIA AG
-
ADASH
-
Amptek
-
AOiP
-
AstroNova
-
AWSensors
-
Automatic Research
-
BASI
-
BRS
-
BWB Technologies
-
Cmc
-
CTRL
-
CALMET
-
CHECKLINE
-
Coxem
-
C-Tech
-
DV Power
-
DANATRONICS
-
ECH
-
Elsys
-
Enervac
-
Enapter
-
ELVEFLOW
-
EA Technology
-
EL-CELL
-
ENERGY SUPPORT
-
Electrothermal
-
FASTEC
-
GE
-
GMW
-
Gaskatel
-
GIUSSANI
-
Globecore
-
GREENLIGHT
-
GRZ
-
HTW
-
HIGH SENSE SOLUTIONSHTW
-
HUBER
-
Labnics
-
Ida
-
LIQUID
-
Instytut Fotonowy
-
KEHUA TECH
-
JGG
-
HVPD
-
Jenway
-
Jacomex
-
IVIUM
-
ndb
-
OZM
-
Redoxme
-
Serstech
-
SATIR
-
VacCoat
-
Zurich
- AARONIA AG
- ADASH
- Amptek
- AOiP
- AstroNova
- AWSensors
- Automatic Research
- BASI
- BRS
- BWB Technologies
- Cmc
- CTRL
- CALMET
- CHECKLINE
- Coxem
- C-Tech
- DV Power
- DANATRONICS
- ECH
- Elsys
- Enervac
- Enapter
- ELVEFLOW
- EA Technology
- EL-CELL
- ENERGY SUPPORT
- Electrothermal
- FASTEC
- GE
- GMW
- Gaskatel
- GIUSSANI
- Globecore
- GREENLIGHT
- GRZ
- HTW
- HIGH SENSE SOLUTIONSHTW
- HUBER
- Labnics
- Ida
- LIQUID
- Instytut Fotonowy
- KEHUA TECH
- JGG
- HVPD
- Jenway
- Jacomex
- IVIUM
- ndb
- OZM
- Redoxme
- Serstech
- SATIR
- VacCoat
- Zurich
LBIC-PL-EL 設定
Combined and Customized Laser Beam Induced Current, Photoluminescence and Electroluminescence Setups 型號：LBIC-PL-EL
Fast and reliable photocurrent mapping with highest resolution
-
- Fast and reliable photocurrent mapping with highest resolution
- In-depth defect detection, visualization and identification – shunts, coating defects, localize inactive regions
- Study degradation effects
- Quality control tool
- A laser beam scans the sample and the excited photocurrent is measured and the spectrally resolved luminescence is simultaneously detected
- Electrical excitation for electroluminescence measurements
- Different (multiple) laser wavelengths available
- Up to 300×300 mm² scanning area
- Mapping of all kinds of solar technologies: Perovskite, Organic, Silicon, CIGS, CdTE,
-
- Different laser choices
- Laser check for beam circularity
- Versatile sample holder
- Easy to use control software with data export
- Different detector options for luminescence measurements, optimized to application and budget
PL/EL Options
Art. No. Description PL PL Upgrade – high quality detector system optimized for each application from 200-1700 nm EL EL Upgrade (PL option required) FC Fiber bundle connector for using the detector system with other inputs