表徵樣品測量設備
> Characterization sample measurement equipment
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瞬態測量單元（TMU）
Transient Measurement Unit (TMU)TMU◎Semiconductor characterization
◎Measurement of every relevant solar cell parameter
◎Know your device limitations – Improve your devices
◎Study ageing behavior加入諮詢加入諮詢 -
IV測量單位
IV Measurement UnitSoftware controlled switching between measurement modes and contacts加入諮詢加入諮詢 -
LBIC 設定
Customized Photocurrent Mapping of Solar Cells and ModulesLBICLaser choices
◎Standard: 445 nm wavelength, 10mW power
◎405 nm, 532 nm, and many more加入諮詢加入諮詢 -
LBIC-PL-EL 設定
Combined and Customized Laser Beam Induced Current, Photoluminescence and Electroluminescence SetupsLBIC-PL-ELFast and reliable photocurrent mapping with highest resolution加入諮詢加入諮詢 -
MPP 追蹤器
MPP TrackerMPP TrackerTracking by adjusting electronic loads to the solar cell operating point加入諮詢加入諮詢 -
激光圖案化ITO和FTO基板
Laser Patterned ITO and FTO SubstratesConsumablesHigh quality substrates for optoelectronic applications, i.e.加入諮詢加入諮詢