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Automatic Research > 表徵樣品測量設備

瞬態測量單元（TMU）

Transient Measurement Unit (TMU) 型號：TMU

◎Semiconductor characterization
◎Measurement of every relevant solar cell parameter
◎Know your device limitations – Improve your devices
◎Study ageing behavior

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Features Specifications

Applications
- Semiconductor characterization
- Measurement of every relevant solar cell parameter
- Know your device limitations – Improve your devices
- Study ageing behavior
Key features
- Customized sample holders
- Glovebox integration possible
- Parameter extraction software modules
- Modular setup using high quality instruments
- Software controlled switching between measurement modes and contacts
- Sample excitation with laser pulses ≥ 20 ns
- Selectable laser (405nm, 520nm, 635nm, 785nm) up to 100 mW
- Power-LED backlight (up to 2000 W/m²)
- Voltage range: +/- 21 V
- Parameter extraction software modules
- Database integration possible
Measurement Modes
- IV – Steady state Current-Voltage characteristics
- TPV / TPC – Transient Photo Voltage / Current
- CE – Charge Extraction
- (Photo-)CELIV – Charge Extraction by Linearly Increasing Voltage
Enabling the customer to determine values for charge carrier lifetime, density and mobility of thin film devices.

TMU	Transient Measurement Unit
OB	Optical box size 600x450x300 mm3 for high flexibility
SOB	Small optical box 250x250x500 mm³ for glovebox integration
X-Lyyy-zz mW	Laser diode No. X with wavelength yyy nm and zz mW maximum power (Laser No.1 is the main laser – up to 3 lasers possible)
MP	Multiplexer for automatic measurements of substrates with more than 1 contact – 8 channels standard
EC	Environmental chamber for keeping the sample in nitrogen atmosphere during measurement. Maximum sample size 75×75 mm².
ECQG	Environmental chamber with quartz glass window

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瞬態測量單元（TMU）

Applications

Key features

Measurement Modes

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